Thriving on the most complex challenges, our experienced multi-
disciplinary teams work closely with our customers to identify their
needs, before innovating to create breakthrough metrology
solutions. Nova’s solutions enable advanced inline control of critical
properties throughout the semiconductor process lifecycle. Nova’s
holistic approach combines robust high-precision hardware with
the finest physical and mathematical software solutions, which
interlace machine learning and big data capabilities. Our unique
portfolio allows our customers to gain deeper insights while
increasing yields and shortening time to market.